THE HIGH AND LOW TEMPERATURE TEST SCHEME OF DC-DC CONVERTERS
Keywords:
DC-DC converters, High-low temperature test, Automated Test Equipment (ATE)Abstract
This paper presents an optimized high-low temperature test scheme for DC-DC converters, addressing the challenges of test stability, efficiency, and temperature control. The proposed scheme, utilizing an Automated Test Equipment (ATE) system and a thermal shield, significantly improves upon the original testing method. It effectively mitigates test stability issues, enables rapid temperature changes, and completes single temperature testing in one step, thereby enhancing test efficiency. Moreover, it provides precise temperature control during testing, avoiding influences from the circuit’s heat and environmental temperature. The results validate the superiority of the optimized scheme over the original, marking a significant advancement in the high-low temperature testing of DC-DC converters. This study contributes to the ongoing efforts to improve the reliability and performance of DC-DC converters, which are pivotal in various sectors. Future work could explore further enhancements to the testing scheme and its applicability to other electronic devices.References
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